Image SXM is a version of the public domain image analysis software NIH Image that has been extended to handle the loading, display and analysis of scanning microscope images. Image SXM supports SAM, SCM, SEM, SFM, SLM, SNOM, SPM and STM images from the following systems: Burleigh Instruments, Digital Instruments NanoScope II, Digital Instruments NanoScope III/IV, DME Rasterscope, DME Surface Data File, Gatan DigitalMicrograph, JEOL JSM, JEOL WinSem, JEOL WinSPM, JPK Instruments, Klocke Nanotechnik Atomikro, Leica TCS, LEO SEM, Molecular Imaging PicoScan, NanoMagnetics Instruments SPMSIF, Nanonics Imaging, Nanotec Electronica WSxM, Noran Instruments Vantage, NT-MDT, Omicron Vakuumphysik, Omicron SCALA, Oxford Instruments TOPSystem, Park Scientific Instruments HFS-LIF, Park Scientific Instruments HDF, Philips SEM, Quesant Instruments, RHK Technology SPM-32, RHK Technology XPM Pro, Seiko Instruments (SIINT) SPI, SPECS STM Aarhus, ThermoMicroscopes, TopoMetrix SPMLab, Unisoku, Vacuum Generators SAM, WA Technology, Zeiss LSM.
What's New: Support for RHK Technology XPM Pro SPM images.
Support for NEF images from Nikon D200 DSLR cameras.
A new 'Mineral Phase Analysis' item.
A new 'Particulate Matter Analysis' item.
SPECS STM Aarhus files can be split into a set of SXM files.
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